Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs - researchr publication authors

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Aruru Sai Kumar, M. Deekshana, V. Bharath Sreenivasulu, Rajendra Prasad Somineni, D. Kanthi Sudha. Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs. In 13th International Conference on Computing Communication and Networking Technologies, ICCCNT 2022, Kharagpur, India, October 3-5, 2022. pages 1-5, IEEE, 2022. [doi]

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