Aruru Sai Kumar, M. Deekshana, V. Bharath Sreenivasulu, Rajendra Prasad Somineni, D. Kanthi Sudha. Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs. In 13th International Conference on Computing Communication and Networking Technologies, ICCCNT 2022, Kharagpur, India, October 3-5, 2022. pages 1-5, IEEE, 2022. [doi]
@inproceedings{KumarDSSS22, title = {Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs}, author = {Aruru Sai Kumar and M. Deekshana and V. Bharath Sreenivasulu and Rajendra Prasad Somineni and D. Kanthi Sudha}, year = {2022}, doi = {10.1109/ICCCNT54827.2022.9984269}, url = {https://doi.org/10.1109/ICCCNT54827.2022.9984269}, researchr = {https://researchr.org/publication/KumarDSSS22}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {13th International Conference on Computing Communication and Networking Technologies, ICCCNT 2022, Kharagpur, India, October 3-5, 2022}, publisher = {IEEE}, isbn = {978-1-6654-5262-5}, }