Shashi Kumar, Yuji Iwahori, M. K. Bhuyan. PCB Defect Classification Using Logical Combination of Segmented Copper and Non-copper Part. In Balasubramanian Raman, Sanjeev Kumar, Partha Pratim Roy, Debashis Sen, editors, Proceedings of International Conference on Computer Vision and Image Processing - CVIP 2016, Indian Institute of Technology Roorkee, February 26-28, 2016, Volume 1. Volume 459 of Advances in Intelligent Systems and Computing, pages 523-532, Springer, 2016. [doi]
Abstract is missing.