Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies - researchr publication authors

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Ranjith Kumar, Volkan Kursun. Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

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