Ranjith Kumar, Volkan Kursun. Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]
@inproceedings{KumarK06,
title = {Impact of temperature fluctuations on circuit characteristics in 180nm and 65nm CMOS technologies},
author = {Ranjith Kumar and Volkan Kursun},
year = {2006},
doi = {10.1109/ISCAS.2006.1693470},
url = {http://dx.doi.org/10.1109/ISCAS.2006.1693470},
researchr = {https://researchr.org/publication/KumarK06},
cites = {0},
citedby = {0},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece},
publisher = {IEEE},
}