Analysis of electrode thickness variation on performance parameters of polymer thin film transistors using device simulation

Brijesh Kumar, Brajesh Kumar Kaushik, Yuvraj Singh Negi. Analysis of electrode thickness variation on performance parameters of polymer thin film transistors using device simulation. IJAIP, 5(1/2):3-15, 2013. [doi]

@article{KumarKN13,
  title = {Analysis of electrode thickness variation on performance parameters of polymer thin film transistors using device simulation},
  author = {Brijesh Kumar and Brajesh Kumar Kaushik and Yuvraj Singh Negi},
  year = {2013},
  doi = {10.1504/IJAIP.2013.054667},
  url = {http://dx.doi.org/10.1504/IJAIP.2013.054667},
  researchr = {https://researchr.org/publication/KumarKN13},
  cites = {0},
  citedby = {0},
  journal = {IJAIP},
  volume = {5},
  number = {1/2},
  pages = {3-15},
}