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Brijesh Kumar, Brajesh Kumar Kaushik, Yuvraj Singh Negi. Analysis of electrode thickness variation on performance parameters of polymer thin film transistors using device simulation. IJAIP, 5(1/2):3-15, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Analysis of electrical parameters of organic thin film transistors based on thickness variation in semiconducting and dielectric layersBrijesh Kumar, Brajesh Kumar Kaushik, Yuvraj Singh Negi. iet-cds, 8(2):131-140, 2014. [doi] Top and Bottom Gate Polymeric Thin Film Transistor Analysis through Two Dimensional Numerical Device SimulationBrijesh Kumar, Poornima Mittal, Yuvraj Singh Negi, Brajesh Kumar Kaushik. socpros 2012: 855-864 [doi]
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