Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT)

Pankaj Kumar, Pravin Kondekar, Sangeeta Singh, Ishu Agrawal. Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT). In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 56-59, IEEE, 2013. [doi]

@inproceedings{KumarKSA13,
  title = {Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT)},
  author = {Pankaj Kumar and Pravin Kondekar and Sangeeta Singh and Ishu Agrawal},
  year = {2013},
  doi = {10.1109/ICECS.2013.6815344},
  url = {http://dx.doi.org/10.1109/ICECS.2013.6815344},
  researchr = {https://researchr.org/publication/KumarKSA13},
  cites = {0},
  citedby = {0},
  pages = {56-59},
  booktitle = {20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013},
  publisher = {IEEE},
}