Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT)

Pankaj Kumar, Pravin Kondekar, Sangeeta Singh, Ishu Agrawal. Characteristics and sensitivity analysis of Gate Inside Junctionless Transistor (GI-JLT). In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 56-59, IEEE, 2013. [doi]

Abstract

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