B. Kiran Kumar, Parag K. Lala. On-line Detection of Faults in Carry-Select Adders. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 912-918, IEEE Computer Society, 2003. [doi]
Abstract is missing.