Vinu Vijay Kumar, John Lach. Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 571, IEEE Computer Society, 2003. [doi]
@inproceedings{KumarL03, title = {Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead}, author = {Vinu Vijay Kumar and John Lach}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420571abs.htm}, tags = {redundancy}, researchr = {https://researchr.org/publication/KumarL03}, cites = {0}, citedby = {0}, pages = {571}, booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-2042-1}, }