R. Kumar, A. Lall, S. Chaudhari, M. Kale, A. Vattem. Garbage Vulnerable Point Monitoring using IoT and Computer Vision. In 11th IEEE World Forum on Internet of Things, WF-IoT 2025, Chengdu, China, October 27-30, 2025. pages 1-6, IEEE, 2025. [doi]
Abstract is missing.