Binod Kumar, Boda Nehru, Brajesh Pandey, Virendra Singh, Jaynarayan T. Tudu. A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture. In 2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{KumarNPST16, title = {A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture}, author = {Binod Kumar and Boda Nehru and Brajesh Pandey and Virendra Singh and Jaynarayan T. Tudu}, year = {2016}, doi = {10.1109/EWDTS.2016.7807675}, url = {http://dx.doi.org/10.1109/EWDTS.2016.7807675}, researchr = {https://researchr.org/publication/KumarNPST16}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016}, publisher = {IEEE}, isbn = {978-1-5090-0693-9}, }