Binod Kumar, Boda Nehru, Brajesh Pandey, Virendra Singh, Jaynarayan T. Tudu. A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture. In 2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016. pages 1-4, IEEE, 2016. [doi]
Abstract is missing.