Decoupling of Demagnetization Characteristics to Improve the Turn-to-Turn Fault Detection in PMSM Using Machine Learning Methods

Logesh Kumar, Sivakumar Nadarajan, Viswanathan Vaiyapuri, Amit Gupta, Boon-Hee Soong, Hung Dinh Nguyen 0001. Decoupling of Demagnetization Characteristics to Improve the Turn-to-Turn Fault Detection in PMSM Using Machine Learning Methods. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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