Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
M. Jagadesh Kumar, Vikram Verma. Elimination of bipolar induced drain breakdown and single transistor latch in submicron PD SOI MOSFET. IEEE Transactions on Reliability, 51(3):367-370, 2002. [doi]
Abstract is missing.