Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices

Rustam Kumar, Tian-Li Wu. Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices. IEEE Transactions on Industrial Electronics, 71(9):11706-11709, September 2024. [doi]

Abstract

Abstract is missing.