Kishore Kunal, Pawan Kumar Upadhyay, M. Ramasubramaniam, M. J. Xavier. Mura Defect Detection in Flat Panel Display Using B-Spline Approximation. In Richard Chbeir, Yannis Manolopoulos, Rajendra Prasath, editors, Mining Intelligence and Knowledge Exploration - 9th International Conference, MIKE 2021, Hammamet, Tunisia, November 1-3, 2021, Proceedings. Volume 13119 of Lecture Notes in Computer Science, pages 102-108, Springer, 2021. [doi]
Abstract is missing.