Sandip Kundu. Managing Reliability of Integrated Circuits: Lifetime Metering and Design for Healing. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 227, IEEE Computer Society, 2016. [doi]
@inproceedings{Kundu16-0,
title = {Managing Reliability of Integrated Circuits: Lifetime Metering and Design for Healing},
author = {Sandip Kundu},
year = {2016},
doi = {10.1109/ATS.2016.80},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.80},
researchr = {https://researchr.org/publication/Kundu16-0},
cites = {0},
citedby = {0},
pages = {227},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}