Managing Reliability of Integrated Circuits: Lifetime Metering and Design for Healing

Sandip Kundu. Managing Reliability of Integrated Circuits: Lifetime Metering and Design for Healing. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 227, IEEE Computer Society, 2016. [doi]

Abstract

Abstract is missing.