Efficient Don t Care Filling for Power Reduction during Testing

Subhadip Kundu, Santanu Chattopadhyay. Efficient Don t Care Filling for Power Reduction during Testing. In ARTCom 2009, International Conference on Advances in Recent Technologies in Communication and Computing, Kottayam, Kerala, India, 27-28 October 2009. pages 319-323, IEEE Computer Society, 2009. [doi]

Authors

Subhadip Kundu

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Santanu Chattopadhyay

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