Subhadip Kundu, Santanu Chattopadhyay. Efficient Don t Care Filling for Power Reduction during Testing. In ARTCom 2009, International Conference on Advances in Recent Technologies in Communication and Computing, Kottayam, Kerala, India, 27-28 October 2009. pages 319-323, IEEE Computer Society, 2009. [doi]
@inproceedings{KunduC09,
title = {Efficient Don t Care Filling for Power Reduction during Testing},
author = {Subhadip Kundu and Santanu Chattopadhyay},
year = {2009},
doi = {10.1109/ARTCom.2009.141},
url = {http://doi.ieeecomputersociety.org/10.1109/ARTCom.2009.141},
tags = {testing},
researchr = {https://researchr.org/publication/KunduC09},
cites = {0},
citedby = {0},
pages = {319-323},
booktitle = {ARTCom 2009, International Conference on Advances in Recent Technologies in Communication and Computing, Kottayam, Kerala, India, 27-28 October 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3845-7},
}