Yuji Kunitake, Toshinori Sato, Hiroto Yasuura, Takanori Hayashida. Guidelines for mitigating NBTI degradation in on-chip memories. In International Symposium on Communications and Information Technologies, ISCIT 2012, Gold Coast, Australia, October 2-5, 2012. pages 822-827, IEEE, 2012. [doi]
Abstract is missing.