Wolfgang Kunz, Dhiraj K. Pradhan. Recursive Learning: An Attractive Alternative to the Decision Tree for Test Genration in Digital Circuits. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 816-825, IEEE Computer Society, 1992.
@inproceedings{KunzP92,
title = {Recursive Learning: An Attractive Alternative to the Decision Tree for Test Genration in Digital Circuits},
author = {Wolfgang Kunz and Dhiraj K. Pradhan},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/KunzP92},
cites = {0},
citedby = {0},
pages = {816-825},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}