Arno Kunzmann. Test pattern generation hardware motivated by pseudo-exhaustive test techniques. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 240-245, IEEE Computer Society, 1994. [doi]
@inproceedings{Kunzmann94,
title = {Test pattern generation hardware motivated by pseudo-exhaustive test techniques},
author = {Arno Kunzmann},
year = {1994},
doi = {10.1145/198174.198252},
url = {http://doi.acm.org/10.1145/198174.198252},
tags = {testing},
researchr = {https://researchr.org/publication/Kunzmann94},
cites = {0},
citedby = {0},
pages = {240-245},
booktitle = {Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994},
editor = {Jean Mermet},
publisher = {IEEE Computer Society},
isbn = {0-89791-685-9},
}