Gate-Delay Fault Test with Conventional Scan-Design - researchr publication authors

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Arno Kunzmann, Frank Böhland. Gate-Delay Fault Test with Conventional Scan-Design. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 524-528, IEEE Computer Society, 1994.

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