Arno Kunzmann, Frank Böhland. Self-test of sequential circuits with deterministic test pattern sequences. J. Electronic Testing, 5(2-3):307-312, 1994. [doi]
@article{KunzmannB94,
title = {Self-test of sequential circuits with deterministic test pattern sequences},
author = {Arno Kunzmann and Frank Böhland},
year = {1994},
doi = {10.1007/BF00972090},
url = {http://dx.doi.org/10.1007/BF00972090},
tags = {testing},
researchr = {https://researchr.org/publication/KunzmannB94},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {5},
number = {2-3},
pages = {307-312},
}