Fast Statistical Analysis of Process Variation Effects Using Accurate PLL Behavioral Models

Chin-Cheng Kuo, Meng-Jung Lee, Chien-Nan Jimmy Liu, Ching-Ji Huang. Fast Statistical Analysis of Process Variation Effects Using Accurate PLL Behavioral Models. IEEE Trans. on Circuits and Systems, 56-I(6):1160-1172, 2009. [doi]

@article{KuoLLH09-0,
  title = {Fast Statistical Analysis of Process Variation Effects Using Accurate PLL Behavioral Models},
  author = {Chin-Cheng Kuo and Meng-Jung Lee and Chien-Nan Jimmy Liu and Ching-Ji Huang},
  year = {2009},
  doi = {10.1109/TCSI.2008.2008502},
  url = {http://dx.doi.org/10.1109/TCSI.2008.2008502},
  researchr = {https://researchr.org/publication/KuoLLH09-0},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {56-I},
  number = {6},
  pages = {1160-1172},
}