Fast Statistical Analysis of Process Variation Effects Using Accurate PLL Behavioral Models

Chin-Cheng Kuo, Meng-Jung Lee, Chien-Nan Jimmy Liu, Ching-Ji Huang. Fast Statistical Analysis of Process Variation Effects Using Accurate PLL Behavioral Models. IEEE Trans. on Circuits and Systems, 56-I(6):1160-1172, 2009. [doi]

Abstract

Abstract is missing.