Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection

Wen-Che Kuo, Indu Sarangadharan, Anil Kumar Pulikkathodi, Po-Hsuan Chen, Shin-Li Wang, Chang-Run Wu, Yu-Lin Wang. Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection. Sensors, 19(7):1484, 2019. [doi]

Authors

Wen-Che Kuo

This author has not been identified. Look up 'Wen-Che Kuo' in Google

Indu Sarangadharan

This author has not been identified. Look up 'Indu Sarangadharan' in Google

Anil Kumar Pulikkathodi

This author has not been identified. Look up 'Anil Kumar Pulikkathodi' in Google

Po-Hsuan Chen

This author has not been identified. Look up 'Po-Hsuan Chen' in Google

Shin-Li Wang

This author has not been identified. Look up 'Shin-Li Wang' in Google

Chang-Run Wu

This author has not been identified. Look up 'Chang-Run Wu' in Google

Yu-Lin Wang

This author has not been identified. Look up 'Yu-Lin Wang' in Google