Wen-Che Kuo, Indu Sarangadharan, Anil Kumar Pulikkathodi, Po-Hsuan Chen, Shin-Li Wang, Chang-Run Wu, Yu-Lin Wang. Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection. Sensors, 19(7):1484, 2019. [doi]
@article{KuoSPCWWW19,
title = {Investigation of Electrical Stability and Sensitivity of Electric Double Layer Gated Field-Effect Transistors (FETs) for miRNA Detection},
author = {Wen-Che Kuo and Indu Sarangadharan and Anil Kumar Pulikkathodi and Po-Hsuan Chen and Shin-Li Wang and Chang-Run Wu and Yu-Lin Wang},
year = {2019},
doi = {10.3390/s19071484},
url = {https://doi.org/10.3390/s19071484},
researchr = {https://researchr.org/publication/KuoSPCWWW19},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {19},
number = {7},
pages = {1484},
}