Prathmi Kurtiker, Ramrao Wagh. Monitoring Student Frustration Level Using Blackbox Logs. In Maiga Chang, Nian-Shing Chen, Ronghuai Huang, Kinshuk, Kannan M. Moudgalya, Sahana Murthy, Demetrios G. Sampson, editors, 18th IEEE International Conference on Advanced Learning Technologies, ICALT 2018, Mumbai, India, July 9-13, 2018. pages 225-226, IEEE Computer Society, 2018. [doi]
@inproceedings{KurtikerW18,
title = {Monitoring Student Frustration Level Using Blackbox Logs},
author = {Prathmi Kurtiker and Ramrao Wagh},
year = {2018},
doi = {10.1109/ICALT.2018.00119},
url = {http://doi.ieeecomputersociety.org/10.1109/ICALT.2018.00119},
researchr = {https://researchr.org/publication/KurtikerW18},
cites = {0},
citedby = {0},
pages = {225-226},
booktitle = {18th IEEE International Conference on Advanced Learning Technologies, ICALT 2018, Mumbai, India, July 9-13, 2018},
editor = {Maiga Chang and Nian-Shing Chen and Ronghuai Huang and Kinshuk and Kannan M. Moudgalya and Sahana Murthy and Demetrios G. Sampson},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-6049-2},
}