Marek Kurzynski, Edward Puchala. The Optimal Feature Extraction Procedure for Statistical Pattern Recognition. In Marina L. Gavrilova, Osvaldo Gervasi, Vipin Kumar, Chih Jeng Kenneth Tan, David Taniar, Antonio Laganà , Youngsong Mun, Hyunseung Choo, editors, Computational Science and Its Applications - ICCSA 2006, International Conference, Glasgow, UK, May 8-11, 2006, Proceedings, Part III. Volume 3982 of Lecture Notes in Computer Science, pages 1210-1215, Springer, 2006. [doi]
@inproceedings{KurzynskiP06,
title = {The Optimal Feature Extraction Procedure for Statistical Pattern Recognition},
author = {Marek Kurzynski and Edward Puchala},
year = {2006},
doi = {10.1007/11751595_127},
url = {http://dx.doi.org/10.1007/11751595_127},
researchr = {https://researchr.org/publication/KurzynskiP06},
cites = {0},
citedby = {0},
pages = {1210-1215},
booktitle = {Computational Science and Its Applications - ICCSA 2006, International Conference, Glasgow, UK, May 8-11, 2006, Proceedings, Part III},
editor = {Marina L. Gavrilova and Osvaldo Gervasi and Vipin Kumar and Chih Jeng Kenneth Tan and David Taniar and Antonio Laganà and Youngsong Mun and Hyunseung Choo},
volume = {3982},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-34075-0},
}