Osamu Kusumoto, Atsushi Ohoka, Nobuyuki Horikawa, Kohtaro Tanaka, Masahiko Niwayama, Masao Uchida, Yoshihiko Kanzawa, Kazuyuki Sawada, Tetsuzo Ueda. Reliability of Diode-Integrated SiC Power MOSFET(DioMOS). Microelectronics Reliability, 58:158-163, 2016. [doi]
Abstract is missing.