Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun. Neural network based modeling of HfO::2:: thin film characteristics using Latin Hypercube Sampling. Expert Syst. Appl., 32(2):358-363, 2007. [doi]
Abstract is missing.