A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide

Hyuk Je Kwo, Hyung Suk Yu, Bongman Choi, Jinseon Yeom, Hyungsuk Kim, Tae-Min Park, JaeYong Jeong, Eun-Kyoung Kim. A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 1-6, IEEE, 2024. [doi]

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