Byeongjun Kwon, Munchurl Kim. One Look is Enough: Seamless Patchwise Refinement for Zero-Shot Monocular Depth Estimation on High-Resolution Images. In IEEE/CVF International Conference on Computer Vision, ICCV 2025, Honolulu, HI, USA, October 19-25, 2025. pages 8077-8087, IEEE, 2025. [doi]
Abstract is missing.