Cross-layer lifetime maximization under reliability and stability constraints in wireless sensor networks

Hojoong Kwon, Tae-Hyun Kim, Sunghyun Choi, Byeong Gi Lee. Cross-layer lifetime maximization under reliability and stability constraints in wireless sensor networks. In Proceedings of IEEE International Conference on Communications, ICC 2005, Seoul, Korea, 16-20 May 2005. pages 3285-3289, IEEE, 2005. [doi]

Abstract

Abstract is missing.