Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity - researchr publication authors

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Soonhak Kwon, Chang Hoon Kim, Chun-Pyo Hong. Fast Irreducibility Testing for XTR Using a Gaussian Normal Basis of Low Complexity. In Helena Handschuh, M. Anwar Hasan, editors, Selected Areas in Cryptography, 11th International Workshop, SAC 2004, Waterloo, Canada, August 9-10, 2004, Revised Selected Papers. Volume 3357 of Lecture Notes in Computer Science, pages 144-158, Springer, 2004. [doi]

This author has not been identified. Look up 'Soonhak Kwon' in GoogleThis author has not been identified. Look up 'Chang Hoon Kim' in GoogleThis author has not been identified. Look up 'Chun-Pyo Hong' in Google

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