Variation-Aware SRAM Cell Optimization Using Deep Neural Network-Based Sensitivity Analysis

Hyun-jeong Kwon, Daeyeon Kim, Young-Hwan Kim, Seokhyeong Kang. Variation-Aware SRAM Cell Optimization Using Deep Neural Network-Based Sensitivity Analysis. IEEE Trans. Circuits Syst. I Regul. Pap., 68(4):1567-1577, 2021. [doi]

Abstract

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