User profiling via application usage pattern on digital devices for digital forensics

Hongkyun Kwon, Sangjin Lee, Doowon Jeong. User profiling via application usage pattern on digital devices for digital forensics. Expert Syst. Appl., 168:114488, 2021. [doi]

Authors

Hongkyun Kwon

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Sangjin Lee

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Doowon Jeong

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