Hongkyun Kwon, Sangjin Lee, Doowon Jeong. User profiling via application usage pattern on digital devices for digital forensics. Expert Syst. Appl., 168:114488, 2021. [doi]
@article{KwonLJ21,
title = {User profiling via application usage pattern on digital devices for digital forensics},
author = {Hongkyun Kwon and Sangjin Lee and Doowon Jeong},
year = {2021},
doi = {10.1016/j.eswa.2020.114488},
url = {https://doi.org/10.1016/j.eswa.2020.114488},
researchr = {https://researchr.org/publication/KwonLJ21},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {168},
pages = {114488},
}