Jaerock Kwon, David Mayerich, Yoonsuck Choe. Automated cropping and artifact removal for knife-edge scanning microscopy. In Proceedings of the 8th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, ISBI 2011, March 30 - April 2, 2011, Chicago, Illinois, USA. pages 1366-1369, IEEE, 2011. [doi]
Abstract is missing.