Jaerock Kwon, David Mayerich, Yoonsuck Choe, Bruce H. McCormick. Automated lateral sectioning for Knife-Edge Scanning Microscopy. In Proceedings of the 2008 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Paris, France, May 14-17, 2008. pages 1371-1374, IEEE, 2008. [doi]
Abstract is missing.