Sunjae Kwon, Duksan Ryu, Jongmoon Baik. eCPDP: Early Cross-Project Defect Prediction. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021. pages 470-481, IEEE, 2021. [doi]
Abstract is missing.