Young-Jun Kwon, D. M. H. Walker. Yiel Learning via Functional Test Data. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 626-635, IEEE Computer Society, 1995.
@inproceedings{KwonW95,
title = {Yiel Learning via Functional Test Data},
author = {Young-Jun Kwon and D. M. H. Walker},
year = {1995},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/KwonW95},
cites = {0},
citedby = {0},
pages = {626-635},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}