Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz

John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs. Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE T. Instrumentation and Measurement, 56(2):481-485, 2007. [doi]

Authors

John R. Labenski

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Wes Tew

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Sae Woo Nam

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Samuel P. Benz

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Paul D. Dresselhaus

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Charles J. Burroughs

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