John R. Labenski, Wes Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs. Resistance-Based Scaling of Noise Temperatures From 1 kHz to 1 MHz. IEEE T. Instrumentation and Measurement, 56(2):481-485, 2007. [doi]
Abstract is missing.