Aymen Ladhar, Mohamed Masmoudi. Analysis and diagnosis of multiple simultaneous defects. In 16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009, Yasmine Hammamet, Tunesia, 13-19 December, 2009. pages 671-674, IEEE, 2009. [doi]
@inproceedings{LadharM09, title = {Analysis and diagnosis of multiple simultaneous defects}, author = {Aymen Ladhar and Mohamed Masmoudi}, year = {2009}, doi = {10.1109/ICECS.2009.5410808}, url = {http://dx.doi.org/10.1109/ICECS.2009.5410808}, researchr = {https://researchr.org/publication/LadharM09}, cites = {0}, citedby = {0}, pages = {671-674}, booktitle = {16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009, Yasmine Hammamet, Tunesia, 13-19 December, 2009}, publisher = {IEEE}, isbn = {978-1-4244-5090-9}, }