Aymen Ladhar - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 8 from 8

2023

On Using Cell-Aware Methodology for SRAM Bit Cell TestingX. Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, G. di Pendina, Patrick Girard 0001, Arnaud Virazel. ets 2023: 1-4 [doi]

2021

A Learning-Based Methodology for Accelerating Cell-Aware Model GenerationP. d'Hondt, Aymen Ladhar, Patrick Girard 0001, Arnaud Virazel. date 2021: 1580-1585 [doi]

Cell-Aware Diagnosis of Customer Returns Using Bayesian InferenceS. Mhamdi, P. Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar. isqed 2021: 48-53 [doi]

2010

Extraction and Simulation of Intra-gate Defects Affecting CMOS LibrariesAymen Ladhar, Mohamed Masmoudi. jcp, 5(10):1468-1477, 2010. [doi]

An Effective and Accurate Methodology for the Cell Internal Defect DiagnosisAymen Ladhar, Mohamed Masmoudi. et, 26(6):621-639, 2010. [doi]

2009

Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume dataAymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida. date 2009: 988-993 [doi]

Analysis and diagnosis of multiple simultaneous defectsAymen Ladhar, Mohamed Masmoudi. icecsys 2009: 671-674 [doi]

A novel algorithm to extract open defects from industrial designsAymen Ladhar, Mohamed Masmoudi. icecsys 2009: 675-678 [doi]

Sign in or sign up to see more results.

runs on WebDSL